The Microscience Microscopy Congress 2014, 30 June - 3 July 2014, Manchester, UK
  • An international conference with four parallel sessions
    An international conference with four parallel sessions
  • Europe's largest microscopy and imaging exhibition with over 100 companies
    Europe's largest microscopy and imaging exhibition with over 100 companies
  • A programme of free workshops and access to the RMS Learning Zone
    A programme of free workshops and access to the RMS Learning Zone
  • A full social programme of receptions and Congress Banquet
    A full social programme of receptions and Congress Banquet


Plans for mmc2015 are well-advanced. It is building on the success of 2014 and, for the first time, will incorporate the ever-popular EMAG. Visit the website and see what we have planned.

Provisional Programme

Wednesday 2 July

09.45 - 10.00

Chair's Opening Remarks

Dogan Ozkaya - Johnson Matthey

Dogan Ozkaya works as a Senior Principal Scientist and in charge of electron microscopy team in the Analytical Department at the Johnson Matthey Technology Centre, Sonning Common, UK.  He holds a PhD in Materials Science and Metallurgy from the University of Cambridge.  He carried out postdoctoral research in electron microscopy of various materials in several university departments.

10.00 - 10.45

Extending the dynamic range of microscopy

Daniel O'Connor - National Physical Laboratory (NPL)

A large range of high-value manufactured parts require structures to be produced over large areas (metres squared) to high resolution (micrometres and below). Examples include the structures for photo-voltaic cells and touch-screen plastic electronics, both of which are manufactured on large polymer substrates in a roll-to-roll process. Such parts present significant metrology challenges due to the high dynamic range of surface topography that needs to be measured. It is relatively simple to measure surface topography over large areas to low resolution (essentially form measurement), or over small areas to high resolution (texture measurement), but the combination leads to very long measurement times and large amounts of data. Also, the type of structures varies significantly, examples being repetitive structures such as micro-optical arrays, or randomly situated defects in large sheets of high-quality paper. To add to these challenges, many measurements need to be performed very quickly and on-line. These metrology challenges will be described along with some ideas of which directions to go to solve them. 

12.00 - 12.45  

Smart Manufacturing brings Metrology into Machine Tools

Manfred Prantl - Alicona Imaging GmbH
2.00 - 2.45 

Assessing the performance of Industrial Materials from the centimetre to the nanometre scale using 3D Microscopy

Eric Bennett - National Physical Laboratory (NPL)

There will be a short introduction to the work of the National Physical Laboratory, the Materials Team and in particular the work carried out in the Advanced Engineered Materials Group.

A variety of 3D microscopes have been used to determine the characteristics of surfaces as they are tested to simulate in service conditions and also as part of Standard test methods for evaluation of the models used to predict performance. The 3D imaging of engineering materials as they are tested by different methods provides a new insight into the mechanisms that are responsible for service life. Just the imaging itself can provide useful information as to how the surface is being degraded or changed. The imaging techniques used range from optical microscopes which can cover areas of several centimetres to the micrometre level, confocal microscopy to below the micrometre level with height measurements at the nanometre level and finally SEM techniques at the nanometre level. To illustrate the range of uses, examples will be given in the following material test areas:- • Erosion • Corrosion • Scratch testing • Cavitation • Hardness – fracture toughness measurement • Fracture surfaces • Graphene • In Situ fatigue

Thursday 3 July

09.45 - 10.00

Chair's Opening Remarks

Eric Bennett - National Physical Laboratory (NPL)
10.00 - 10.45

Optical Microscopy for engineering measurement - numbers with confidence

Jon Petzing - Loughborough University

The demand for surface metrology has been increasing over several decades, with industrial requirements for quantification of structured and randomly rough surface features.  This has been matched by the development of a range of dedicated non-contact microscope based techniques for three-dimensional surface measurement, such as; coherence scanning interferometry, confocal microscopy, and focus variation.  Furthermore, more traditional microscope platforms are now being augmented with additional functionality to allow them to produce fully quantified data maps.

When coupled with the developing suite of ISO 25178 standards, the outcome is a growing array of instrumentation and data analysis techniques that are redefining the ability to measure surface structure, and provide greater insight into the engineering functional characteristics of surfaces. However, in all cases it is important to deliver numbers with confidence, requiring artefacts and processes that allow measurements to be traced to the metre.

This talk will illustrate the application of microscope based techniques to solve surface metrology based engineering problems, and the development of traceable areal artefacts and protocols to provide the user with confidence in the data.

12.00 - 12.45 

Advanced Metrology for Round Tools Development

Aiden Lockwood - Sandvik Coromant

Following a short introduction to Sandvik Coromant, the round tools department and product portfolio, the talk will focus on metrology techniques used for development of our drilling products. Primary focus will be non-contact optical methods but will also introduce other metrology techniques used in conjunction to understand cutting mechanisms, tool life, hole quality and wear processes. Key areas of interest are:

  • Automation
  • Repeatability and robustness
  • Flexibility when required to meet customer needs

Future requirements including the need for further automation will be discussed. 

2.00 - 2.45

Particle size distributions from catalysts using electron microscopy

Dogan Ozkaya - Johnson Matthey

The talk will be about how to get particle size distributions from electron microscopy images. Examples will presented from a range of systems including supported nanoparticle, colloidal nanoparticles and zeolites. The results compared to other techniques and 3D and 2D arguments will be dealt with.

Download the app

We are very excited to announce that the mmc2014 conference app has now launched. The app provides lots of useful information on the event, both in the run up to and whilst there. It is available for Apple and Android mobile devices.

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