Advanced Measurement Technology in the 21st Century
Wednesday 2 July - Thursday 3 July 2014
This meeting and exhibition is taking place during the Microscience Microscopy Congress (mmc2014) and is free to attend. It will take place in Central Rooms 5-7 in the foyer.
The industrial marketplace for engineered products and components presents critical measurement challenges. Outperforming your competitors and optimising product quality, requires innovative microscopy and metrology methods. Advanced Measurement Technology in the 21st Century provides the ideal opportunity to see and hear about these modern optical and electron microscopy techniques.
Advanced Measurement Technology in the 21st Century will focus on how the latest techniques in optical and electron microscopy can aid organisations in developing and manufacturing their products to exceed end-user expectations, improve product yield, and meet new regulations.
A number of keynote speakers will share their insights. They include:
- Daniel O'Connor (NPL)
- Jon Petzing (University of Loughborough)
- Aiden Lockwood (Sandvik)
- Dogan Ozkaya (Johnson Matthey)
- Eric Bennett (NPL)
- Manfred Prantl (Alicona Imaging GmbH)
The meeting is aimed at research, design and development engineers, research scientists, production managers, quality engineers, research directors, and anyone having a need to understand today’s measurement technologies.
While you’re there, take the opportunity to visit the free exhibition - the largest microscopy and imaging exhibition in Europe - with over 100 exhibitors. In addition there will be free workshops, and a unique innovation, the free RMS Learning Zone. This fully equipped teaching and learning area will have a programme of seminars - from basic LM and SEM, to ImageJ and SPM - a range of equipment available for you to turn up and use, as well as impartial experts on hand to answer your questions.
Please click here for a downloadable flyer on the event.
Supported by gtma