The Microscience Microscopy Congress 2014, 30 June - 3 July 2014, Manchester, UK
  • An international conference with four parallel sessions
    An international conference with four parallel sessions
  • Europe's largest microscopy and imaging exhibition with over 100 companies
    Europe's largest microscopy and imaging exhibition with over 100 companies
  • A programme of free workshops and access to the RMS Learning Zone
    A programme of free workshops and access to the RMS Learning Zone
  • A full social programme of receptions and Congress Banquet
    A full social programme of receptions and Congress Banquet

VISIT THE MMC2015 WEBSITE FOR THE NEXT EVENT!

Plans for mmc2015 are well-advanced. It is building on the success of 2014 and, for the first time, will incorporate the ever-popular EMAG. Visit the website and see what we have planned.

Dedicated probe for SIMS/SNMS

Posted by: mmc2014 at 1:05 pm on June 30th, 2014

HidenLogoRed.jpgThe Hiden EQS-series of quadrupole mass spectrometer probes were introduced for measurement of external ions in a vacuum environment, specifically for application to the SIMS surface analysis technique

The systems are now even further enhanced by the addition of a new high-efficiency electron bombardment ion source mounted at the immediate entry region to the probe for direct measurement of secondary neutrals(SNMS), enabling quantification of concentration over the full abundance range from trace level to 100%.

The dual techniques are beneficial for diverse surface analyses including measurement of optical and metallurgical coatings, alloys, corrosion layers, architectural coatings. Both SIMS and SNMS can be used throughout a continuous measurement sequence to provide quantified depth profiling data through the widest concentration range.

The probes combine both mass and energy filters for optimum beam transmission efficiency together with refined mass resolution and abundance sensitivity, with mass range options selectable up to 2500amu. They are available with both gas and metal-sourced ion guns to enable SIMS/SNMS upgrade of existing surface analysis facilities, and alternatively as complete standalone SIMS/SNMS Workstations.

For further information on this or any other Hiden Analytical products contact Hiden Analytical at info@hiden.co.uk or visit the main website at www.HidenAnalytical.com.

For further information on this item, click here.

Download the app

We are very excited to announce that the mmc2014 conference app has now launched. The app provides lots of useful information on the event, both in the run up to and whilst there. It is available for Apple and Android mobile devices.

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